Barcode: Global Binary Patterns for Fast Visual Inference

Teng-Yok Lee ,  Sonali Patil ,  Srikumar Ramalingam ,  Yuichi Taguchi ,  and  Bedrich Benes

2017 International Conference on 3D Vision (3DV) - 2017

2017 International Conference on 3D Vision (3DV) - 2017

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Lee, Teng-Yok, et al. “Barcode: Global Binary Patterns for Fast Visual Inference.” 2017 International Conference on 3D Vision (3DV), 2017, pp. 630–39, doi:10.1109/3DV.2017.00077.

@inproceedings{Lee173DV,
  title = {Barcode: Global Binary Patterns for Fast Visual Inference},
  author = {Lee, Teng-Yok and Patil, Sonali and Ramalingam, Srikumar and Taguchi, Yuichi and Benes, Bedrich},
  year = {2017},
  month = oct,
  booktitle = {2017 International Conference on 3D Vision (3DV)},
  pages = {630--639},
  doi = {10.1109/3DV.2017.00077},
  issn = {2475-7888},
  image = {Lee-2017-Barcode_Global_Binary_Patterns_for_Fast_Visual_Inference-thumbnail.jpg},
  pdf = {Lee-2017-Barcode_Global_Binary_Patterns_for_Fast_Visual_Inference.pdf},
  month_numeric = {10}
}